STIL SA: expert in non-contact metrology since 1993.

All our products are based on proprietary technologies.

We can find the optimal solution for YOUR application.
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  • Profilometry
  • Roughness (ISO 25178)
  • Dimensional control
  • Thickness measurement
  • Real-time spectrometry
  • Color monitoring
  • BRDF / BTDF (Spectral or intensity)
  • Scatterometry (Superpoli)
PRIMA4