Applications > Industrial Applications

ELECTRONICS & MICROELECTRONICS

Application 1 : CCD matrix area

Aims :

Non contact measurement of a CCD focal plane, performed through the protecting window,
Measurment of the flatness of the focal plane,
Characterisation of the shape, size and spacing of individual pixels.

Click on image to improve definition

1 - Focal plane of a CCD matrix
(false color Altitude image)

2 - Lowpass-filtered version of image 1, showing the general shape of the focal plane (which should ideally be perfectly flat)

Measurement parameters

Measurement system :

MICROMESURE 2 Profilometer

Controller :

CHR 150 L

Optical pen :

CL1 MG 210

Sample :

Focal plane of a CCD matrix

Material :

SiC

Picture size :

1.1 mm x 1.1 mm

Measurement pitch :

10 µm x 20 µm


1 - Focal plane of a CCD matrix (false color Altitude image)	2 - Lowpass-filtered version of image 1, showing the general shape of the focal plane (which should ideally be perfectly flat)