Applications > Different Materials Home Stil
STIL SA
Plastics Measurements

CERAMICS SAMPLES

 Fabrics Measurements
Non active arrow
 Application 1 : Ink on ceramic substrate
Ceramic Measurement 2

    Aims :

  • Measurement of a conductive ink layer still humid, just after it has been deposited on the ceramic substrate by serigraphy,
  • Measurement of the ink layer thickness before the component is put in the oven,
  • Optimization of the fabrication process.
Click on image to improve definition
1 - Thick conductive ink layer on ceramics (false color Altitude image)
2 - Thick conductive ink layer on ceramics (3D representation)
Measurement parameters
Measurement system :
MICROMESURE 2 Profilometer
Controller :
CHR 150
Optical pen :
CL1 MG 140
Sample :
Electronic component
Material :
Ceramics and Ink
Picture size :
17 mm x 17 mm
Measurement pitch :
10 µm x 10 µm