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Glass Measurements

METAL SAMPLES

 Semiconductors Measurements
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 Application 1: Silver coating
Ceramic Measurement 2

    Aims :

  • Non contact measurement of a silver coating over a ceramic substrate, with no preliminary preparation of the sample,
  • Detection and characterization of defects in the coating,
  • Computation of roughness parameters in compliance with ISO 25178 standard.
Click on image to improve definition
silver coating over a ceramic substrate (false color 3D representation)
silver coating over a ceramic substrate (false color Altitude profile)
1 - silver coating over a ceramic substrate
(false color 3D representation)
2 - silver coating over a ceramic substrate
(false color Altitude profile)
Profile through image 2, allowing computing the rougness parameters according to ISO 25178 standard
Measurement parameters
Measurement system :
MICROMESURE 2 Profilometer
Controller :
CHR 150 L
Optical pen :
CL2 MG 140
Material :
Silver over ceramics
Picture size :
0.5 mm x 0.5 mm
Measurement pitch :
3 µm x 3 µm
3 - Profile through image 2, allowing computing the rougness parameters according to ISO 25178 standard