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STIL SA
Semiconductors Measurements

PLASTIC SAMPLES

 Ceramic Measurements
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 Application 1: Printed characters on plastic substrate
Plastic Measurement 2

    Aims :

  • Characterization of the serigraphy process
  • Measurement of the volume of deposited product
  • Control of deposition regularity.
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Serigraphy over plastic (false color Altitude image)
1 - Serigraphy over plastic (false color Altitude image)
2 - Indication of a line for measuring a profile
Serigraphy over plastic: profile extracted along the line in image 2
Measurement parameters
Measurement system :
MICROMESURE 2 Profilometer
Controller :
CHR 150
Optical pen :
CL2 MG 140
Sample :
Serigraphy over plastic
Picture size :
10 mm x 14 x mm
Measurement pitch :
20 µm x 50 µm
3 - Serigraphy over plastic: profile extracted along the line in image 2