Applications > Different Materials Home Stil
STIL SA
Metal Measurements

SEMICONDUCTORS

 Plastics Measurements
Non active arrow
 Application 1 : Field Emission Display flat screen
Non active arrow

    Aims :

  • Microtopography of a FED flat screen with no need for any preparation of the sample.
  • Detection and characterization of defects.
Click on image to improve definition
1 - FED flat screen (false color Altitude image)
2 - FED flat screen (false color Intensity image)
Measurement parameters
Measurement system :
MICROMESURE 2 Profilometer
Controller :
CHR 150
Optical pen :
OP 20
Sample :
FED flat screen
Material :
Silicium
Picture size :
100 µm x 100 µm
Measurement pitch :
4 µm x 4 µm