| News 04/2011 |
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STIL products at the CONTROL fair – Booth H1 1330
Again this year, STIL will take part in the CONTROL Exhibition, the annual meeting for measurement specialists, which will take place in Stuttgart from May 3rd to 6th 2011.
Our team will be available for you to discuss about our range of high definition “point” sensors. Among others, you will be able to fully discover the advantages of the CCS PRIMA2 controller, which offers two multiplexed measurement channels, thus an obvious price advantage for multipoint measurements.
But as concerns price advantage, what you will certainly mostly appreciate is the brand new STIL-INITIAL. With three different models, each one offering a different measuring range, the “ready-to-use” STIL-INITIAL sensor will give you an access to confocal chromatic measurement for an unbeatable price.
In 2010 the DUO sensor (white light interferometry) and MPLS (line sensor) have met a great success in the fields of semiconductors and consumer electronics. This trend has been confirmed in 2011 with serial integration on production lines.
The range of optical pens gets wider with new models offering new performances. You will now enjoy very long working distance: up to 0.5 meters!
The whole STIL team will have the pleasure to welcome you in Stuttgart in Hall 1 on booth 1330. All welcome to discover our new models!