| News 03/2009 |
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STIL SA exhibits at CONTROL 2009 in Stuttgart.
Like every year, STIL will be exhibiting at CONTROL international trade fair, the annual meeting of the measurement specialists. For the second time, the exhibit will take place in Stuttgart from the 05th to the 08th of May 2009.
Of course, you could discover the enhancements of our extended range of CCS and CHR High Resolution non-contact sensors, as well as our RUBY non-contact spectrocolorimeter, endowed with exclusive performances.
Our MPLS "Multi-Points Line" sensors series will be in the spotlight, crowned with their "Silver Photon", Innovation award received during the last OPTO Show in Paris, France. You will be amazed by their impressive 3D measuring rate.
CONTROL will also be the occasion for STIL to reveal its latest innovations in the field of 2D/3D Automatic Optical Inspection (AOI), as well as an original approach of the interferometric measurement process. Actually, a lot of surprises are waiting for you on our booth, number 7327, in Hall 7.
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