News 06/2009

The new STIL DUO sensor,
a new standard in the world of dimensional measurement.

The new sensor STIL DUO is the first system in the world that simultaneously offers two optical principles for dimensional measurement: The Confocal Chromatic, designed and manufactured by STIL for more than 15 years, and the White Light Spectral Interferometry, whose implementation is today proposed with a very original setup.

By associating these two measurement principles, the sensor STIL DUO creates a new standard in the world of dimensional measurement because it allows the user to get the very best out of these two operating principles:

STIL’s Confocal Chromatic principle, thanks to a wide range of optical pens, covers a much extended measurement dynamics: from 20µm to 25mm. The measurement can be done on any type of material, be it opaque or transparent, reflective or diffusing, at the same time as being in conformity with the prescriptions of the new ISO 25178 standard. It also allows to make very high precision dimensional measurements: from rugosimetry to vibrometry through all applications of 3D control.

STIL’s white light Spectral Interferometry process gives access to sub-nanometric resolutions (axis z) for topography measurements that can be performed within a measurement scale up to 150µm. Moreover, in thickness mode, the thickness of the thinner measurable layers is 1µm. In any case, measurements are totally insensitive to vibrations.

The new sensor STIL DUO possesses the same qualities as any sensor from STIL’s products range: it is perfectly fitted to the industrial environment and its interfacing is very easy, thanks to the many inputs and outputs and an offer including software development kits.

Soon available, the sensor STIL TRIO will offer a third measurement technology enabling the colorimetric analysis. The combination of microspectrometry and microtopography will at last make “true color” 3D metrology available.

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