NEWSLETTER # 8
January - February - March 2011


The whole team at STIL is very pleased to wish you all a Happy New 2011 Year. We hope it to be full of joy and success.

2011 is also the year when STIL celebrates its 18th birthday. Indeed, on January 13th, 1993 the world leader of confocal chromatic was born, and has now come of age.

And because good news usually comes in pairs, STIL is really proud to report record results for year 2010.


content:

STIL enters EDMUND OPTICS™ (EO) catalog

STIL is happy to announce the signature of a distribution agreement with Edmund Optics, a leading supplier of optics and optical components for industry and research labs since 1942.

The confocal chromatic sensor STIL INITIAL is now available with three different models both in Edmund Optics’ catalog, which is distributed in more than 2 millions copies each year, and on the online sale website (www.edmundoptics.com).

This new sensor range allows users to get a high precision measurement in confocal chromatic imaging at a lower cost. Each of the models includes a complete ready for use set (controller, optical pen, optical fiber and software on USB key) for only 5,100 Euros (excl. taxes). This line comprises 3 different models, allowing handling applications with different scales:

The available models are:    

  • STIL Initial 0.4 (measuring range: 0,4 mm ; axial resolution: 22 nm)
  • STIL Initial 4 (measuring range: 4 mm ; axial resolution: 160 nm)
  • STIL Initial 12 (measuring range: 12 mm ; axial resolution: 400 nm)

http://www.edmundoptics.com/onlinecatalog/displayproduct.cfm?productID=3371

STIL Initial, the same unbeatable performances at a new unbeatable price !

This new range of products is from now on available in direct purchase with STIL or with our international distributors.

STIL reorganizes its distribution network in Germany

Polytec

We are happy to announce the signature of a distribution agreement with POLYTEC GmbH. The agreement concerns the distribution of STIL's chromatic confocal chromatic sensors as well as white light interferometric sensors. This agreement takes effect in January 2011. Up till now, STIL products were distributed in Germany under the brand name of an another local distributor. From now on, these same sensors are available at POLYTEC's.

Founded in 1967, the group POLYTEC offers innovative solutions for optical measurement, industrial vision, lighting and photonics. POLYTEC is ISO 9001 certified since 1994.

For more than 40 years POLYTEC has been proposing high-tech solutions for optical measurements to researchers and engineers.

The new agreement is an important step forward in the development of STIL distribution network. In addition to its activities on the German market, POLYTEC’s foreign subsidiaries will distribute STIL sensors.

Contact:

POLYTEC 
T. WIESENDANGER (Allemagne)
 
Tel: +49 7243604-335

t.wiesendanger@polytec.de

Technology focus: Photometric and dimensional characterization of photovoltaic cells

STIL dimensional and photometric sensors are valuable tools for the non-destructive measurement of critical parameters during the different steps of the manufacturing of photovoltaic cells.

Our range of instruments (profilometers and goniophotometers) give an access to many parameters to characterize and inspect photovoltaic cells (thickness, microtopography, roughness, vias depth, scatterometry).

The examples below concern crystaline silicon-type cells. Our sensors have been successfully used for characterizing the following manufacturing steps:

Cutting out of the ingots:
Bow, Warp, Thickness, Roughness
Wafer texturing:
Microtopography, Scatterometry
Deposit of the antireflection coating:
Thickness, Scatterometry
Metallization:
Width and height of contacts, Microtopography
Encapsulation:
Thickness, Topography

Our sensors and systems are used as well in R&D as for industrial production control. These inspection methods also concern:

Thin films: Laser ablation, Laminated back foil thickness
Nano wires:
Diameter, Microtopography
Black silicon:
Microtopography, Scatterometry
TSV:
Via depth, contact holes

Do not hesitate to send your sample and tell us what parameter you wish to measure. Our team of application engineers will select the optimal sensor, perform the measurement and send you a report.

Colorimetric certification of artwork photographs by the RMN agency

Extract from the article “de l’art et des pixels” published in the magazine Ordinateur Individuel + SVM of January 2011, p. 55.

« Respecting colors is an obsession for the photographic service of the RMN. What guaranties the best reliability possible is the spectrocolorimeter RUBY, developed by the French company STIL. It is composed of a controller that sends, via an optical fiber, a light beam with an adaptable diameter on the color to be measured. A second optical fiber retrieves and transmits the tonal information to the controller, which will calculate the LAB value of the color (luminance and chrominance). The spectrocolorimeter also allows the user to redo the LAB values of the color charts that evolve with time, handling and exposure to light. All these measurements are used for establishing a color certification report, which proves that the difference of colors between the RAW file of the photographs agency and the original work of art are imperceptible to the naked eye (delta inferior to 2).”

Crédit photo : RMN – René-Gabriel Ojeda

They talked about us in 2010

The innovative equipments proposed by our company allow our partners and customers to create and expand new solutions for their profession. Various publications (articles, journals) and scientific conferences regularly put forward the original aspect of the methods that are implemented and the gain in performances. Our team of engineers actively participates in the distribution of this literature.

SCIENTIFIC JOURNALS: 

  • Wear, Wear quantification of human Enamel and dental Glass-ceramics using white light profilometry, A.Theocharopoulos, L. Zou, R. Hill, M. Cattell, doi:10.1016/j.wear.2010.08.019

http://dx.doi.org/10.1016/j.wear.2010.08.019

  • Color research & application, Goniophotometry: From measurement to representation in the CIELAB color space, L. Simonot, M. Hébert, D. Dupraz, doi:10.1002/col.20605

http://dx.doi.org/10.1002/col.20605

  • In Situ, Revue des patrimoines n°13, L’étude microtopographique et la visualisation 3D dans l’analyse de gravures préhistoriques – L’exemple des pierres gravées de La Marche, N. Mélard.

http://www.insitu.culture.fr/article.xsp?numero=13&id_article=melard-1424

  • L'ordinateur individuel+SVM n°234 janvier 2011, De l'art et des pixels, p.55

http://www.01net.com/editorial/525103/de-lart-et-des-pixels/

CONFERENCES :

  • CMOI, STILµForce : Développement d'un capteur de micro et nano forces par lévitation diamagnétique, S.Oster, E.Piat, J.Abadie. 
  • CMOI (2010), Diagnostic des œuvres d'art et épaisseur de vernis, Jean-Jacques Ezrati (C2RMF).

For an extended knowledge of our full products range, please visit us at www.stilsa.com and download our e-catalog.

For any further information, or if you want to ship us samples for measurement, please contact our commercial team:

sales@stilsa.com / contact@stilsa.com

STIL S.A.

Domaine de Saint Hilaire

595, rue Pierre Berthier

13855 Aix-en-Provence Cedex 3

France

Téléphone : +33 (0)4 42 39 66 51

Fax. : +33 (0)4 42 24 38 05

To unsubscribe, click here