2011

• STIL enters EDMUND OPTICS™ (EO) catalog
• STIL reorganizes its distribution network in Germany
• Technology focus: Photometric and dimensional characterization of photovoltaic cells
• Colorimetric certification of artwork photographs by the RMN agency
• They talked about us in 2010

2010

• STIL Initial : a new range of controllers with an incredible quality-price ratio
• STIL intensifies its distributor's network in Europe and in the US
• Improved performance of CCS-PRIMA sensor with a new firmware version (version 1.3.1)
• New CCS Prima2 sensor available
• STIL exhibits at CONTROL 2010 international trade fair
• New miniature chromatic confocal optical pens
• Big commercial success in 2010 for the CCS PRIMA 4
• Prices down:
• New 2010 e-catalogue now available:
• The Mona Lisa’s varnish analysed by STIL sensors:
• The IR-i and IR-s REFLET sensors:
• STIL S.A. sensors serve violins’ study:

2009

• STIL’s products at VISION SHOW
• The performances of the CCS PRIMA increased four times
• Inspection of semi-conductors with the new STIL-DUO
• Inspection of photovoltaic cells
• New STIL-DUO sensor
• STIL SA exhibits at CONTROL 2009 in Stuttgart
• CCS Sensors gain in dynamics
• PHOTON LINES, new distributor for STIL’s products

2008

• STIL SA places its sensors in Pole position!
• Diffusers measurement
• STIL S.A. awarded a prize in OPTO 2008
• STIL S.A. exhibits in OPTO 2008
• Cutting tool 3D topography
• Photovoltaic cells
• STIL S.A. takes part in the elaboration of the ISO 25178 standard
• The RUBY spectrocolorimeter
• The CCS Ultima Controller for Point Sensors

2007

• New REFLET and DIAMOND version
• CCS Controllers for point sensors
• MPLS180 Line/Field sensor
• Spectrocolorimetric measurements of artworks

Newsletter

• January, February, March 2011
• October, November, December 2010
• April, May 2010
• December, January, February 2010
• September, October, November 2009
• June, Jully, August 2009
• March, April, May 2009
• December, January, February 2009