• STIL’s products at VISION SHOW
• The performances of the CCS PRIMA increased four times
• Inspection of semi-conductors with the new STIL-DUO
• Inspection of photovoltaic cells
• New STIL-DUO sensor
• STIL SA exhibits at CONTROL 2009 in Stuttgart
• CCS Sensors gain in dynamics
• PHOTON LINES, new distributor for STIL’s products

• STIL SA places its sensors in Pole position!
• Diffusers measurement
• STIL S.A. awarded a prize in OPTO 2008
• STIL S.A. exhibits in OPTO 2008
• Cutting tool 3D topography
• Photovoltaic cells
• STIL S.A. takes part in the elaboration of the ISO 25178 standard
• The RUBY spectrocolorimeter
• The CCS Ultima Controller for Point Sensors

• New REFLET and DIAMOND version
• CCS Controllers for point sensors
• MPLS180 Line/Field sensor
• Spectrocolorimetric measurements of artworks

• December, January, February 2010
• September, October, November 2009
• June, Jully, August 2009
• March, April, May 2009
• December, January, February 2009

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