Since January 1993 , STIL (Sciences et Techniques Industrielles de la Lumière) proposes its skills and its know-how in high-performance optical instrumentation.

Inventor of chromatic confocal imaging and world leader in the domain of chromatic confocal distance sensors, STIL has designed two families of point sensors (CHR and CCS) and a family of line-sensor (MPLS) based on this innovative concept.

These high-resolution non-contact sensors meet the requirements of the most demanding applications, from microtopography to shape and texture analysis and from roughness measurement to reverse engineering, both in industrial environment for in-line inspection during production process and in research laboratories as high precision instruments. They can measure any type of sample (transparent or opaque, polished or rough) and any type of material (metal, glass, ceramic, semiconductor, plastic, fabric...) and do not require any sample preparation.

STIL manufactures and sells stand-alone chromatic confocal sensors as well as a turnkey high precision, multi-sensor 3D measuring system (MICROMESURE).

A second technological activity of STIL concerns scatterometry and spectrocolorimetry. The REFLET double-goniometer for measuring backscattered and transmission lobes features white or colored lighting and integrated-flux or spectral measurement. It allows computing the BRDF/BTDF of all types of samples including mirrors, and may also be used for characterizing light source emission.

STIL dedicates about 50% of its R&D resources to the development of customized equipments, offering OEM-integrators the possibility to stand in the forefront of technological innovation and to efficiently protect themselves by patents against any potential concurrence.