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Line Sensor

World leader in the domain of chromatic confocal sensors, STIL proposes the MPLS 180 line sensor for non-contact 3D measurement meeting the requirements of a large number of applications:

Flip chip warpage measured with the MPLS-180 (Single frame)
  • Cosmetics
  • Surgery
  • Reverse engineering
  • Microelectronics
  • Vibrations
  • Shape deformation
Electronic Board measured with the MPLS-180 (Single frame)


The MPLS 180 sensors consist of two parts linked by a fiber optic bundle cable :
  • controller,
  • optical head.
The controller is the optoelectronic cabinet of the sensor. It comprises the light source (internal or external). The MPLS 180 controller features :
  • 180 points measured simultaneously
  • Up to 1800 lines/s (324 K point/s)
  • External trigger
  • Data transfer by USB 2.0
MPLS 180 Sensor with Large Field Optical Head
The optical head determines the length of the line on the object, the resolution and the measuring range. The addition of an internal scanning mirror inside the optical head converts the MPLS-180 into a field sensor.