Products
Accueil Stil
STIL SA

REFLET

REFLET is a goniophotometer for measuring back-scattering and forward-scattering lobes of diffusing samples.



REFLET-180 optical bench (darkroom, computer and motorization box not shown)

Click on the button to see REFLET-90 bench motion



Applications:
  • Characterization of diffusing samples:
    • paper, powders, ceramics, non-polished metallic surfaces, vehicle control panels.

  • Characterization of transparent samples:
    • flat display, thin films, biological materials.

  • Multi-geometry color measurements of effect materials:
    • metallic paint, ink, fabrics, cosmetics.
Bidirectional reflectance (BRDF) automotive metalic painting measured with STIL REFLET goniophotometer
  • Countertyping,
  • Watermaking,
  • Texture analysis,
  • Quality control,
  • Computer graphics and animation.
Features:
  • Fully controlled illumination beam:
    • Variable illumination angle,
    • Selectable spot-size on the sample,
    • Selectable illumination level.

NEW : REFLET-180 optical bench with 0° to 180° illumination

REFLET measuring system: detail
  • High dynamic range (1:109),
  • The measuring arm of this instrument comprises a (Θ,φ) goniometer.
    This architecture offers signifiant advantages over static measuring systems:
    • Real brdf/btdf measurement: no need for calibration on Spectralon.
    • Full hemisphere measurement (2π sr).
    • High angular resolution (0.1 deg).

  • Spectral and Integrated-flux modes,
  • Crossed polarizers option,
  • 6-position filter wheel option,
  • Portable Instrument,
  • Operates in ambient light conditions.